SST Components has a wide assortment of semiconductor test platforms which provide ample test coverage for numerous device types. Ample test coverage to meet your requirements whether testing to military slash sheets, data book specifications, specified controlled drawings or select parameter testing. For those requirements beyond our current test system limits we have a full complement of rack and stack bench test equipment. Utilizing Agilent GUI programming to interface to a variety of test equipment to employ a custom built test station. Regardless of the phase of your process, we can support preliminary device characterization, final production testing to counterfeit test. Various temperature apparatus allow us to provide the full temperature spectrum of commercial, industrial and military environments to meet your needs. If your screening requirement entails serialization, data recording and deltas throughout your process we will insure device and lot traceability.

SST Components has recently added a 6" diameter ELECTROGLAS wafer probe station complete wiht IWSS wafer mapping which will enhance our current bare die probing capabilities. Just getting started on a new wafer design or maybe you are having yield issues in your packaged devices? Allow our engineering team to review your requirements and provide you with a test solution that meets your probing needs.

SST Components has a wide assortment of semiconductor Assembly, Test and Environmental services, if what you are looking for is not listed; please contact our sales department utilizing our CONTACT US page to discuss your specific requirements.